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Improved thermal stability and stress immunity in highly scalable junctionless FETs using enhanced-depletion channels
Chien Liu, Chun Hu Cheng, Ming Huei Lin, Yi Jia Shih, Yu Wen Hung, Chia Chi Fan, Hsuan Han Chen, Wan Hsin Chen, Chih Chieh Hsu, Bing Yang Shih, Yu Chien Chiu, Wu Ching Chou, Hsiao Hsuan Hsu, Chun Yen Chang
Research output: Contribution to journal › Article › peer-review
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(Scopus)