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Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect
Ming Huei Lin, Yi Jia Shih, Chien Liu, Yu Chien Chiu, Chia Chi Fan, Guan Lin Liou, Chun Hu Cheng*, Chun Yen Chang
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution