@inproceedings{cbb8f056034b4e29901b1ea5ba041929,
title = "Impact of shielding line on CDM ESD robustness of core circuits in a 65-nm CMOS process",
abstract = "The charged-device-model (CDM) ESD robustness of core circuit with/without the shielding line was studied in a 65-nm CMOS process. Verified in silicon chip, the CDM ESD robustness of core circuit with the shielding line was degraded. The damage mechanism and failure location of the test circuits were investigated in this work.",
keywords = "Charged-device model (CDM), ESD, shielding line",
author = "Ker, {Ming Dou} and Lin, {Chun Yu} and {Tang-Long Chang}, Chang",
year = "2011",
doi = "10.1109/IRPS.2011.5784565",
language = "English",
isbn = "9781424491117",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "EL.2.1--EL.2.2",
booktitle = "2011 International Reliability Physics Symposium, IRPS 2011",
note = "49th International Reliability Physics Symposium, IRPS 2011 ; Conference date: 10-04-2011 Through 14-04-2011",
}