Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms

Yu Chien Chiu, Chun Yen Chang, Hsiao Hsuan Hsu, Chun Hu Cheng, Min Hung Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

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Biochemistry, Genetics and Molecular Biology

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Computer Science

Engineering