Imaging near-field transverse modes of vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

Nien Hua Lu, Chih Yen Chen, Chin Sung Lin, Wei Chih Liu, Din Ping Tsai

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have characterized the oxide-confined vertical-cavity surface-emitting laser (VCSEL) using short-tip, tapping-mode tuning fork near-field scanning optical microscopy (TMTF-NSOM). The near-field radiation patterns of the VCSEL were measured. By comparing the topographic and optical images, we attribute the asymmetric transverse modes to the geometric defect outside the oxide aperture. We also performed spatially resolved spectroscopic imaging over the surface of the VCSEL by coupling NSOM to a spectrometer.

Original languageEnglish
JournalScanning
Volume26
Issue number5 SUPPL.
Publication statusPublished - 2004

Fingerprint

Near field scanning optical microscopy
Surface emitting lasers
Laser modes
surface emitting lasers
near fields
microscopy
Imaging techniques
cavities
scanning
forks
Oxides
oxides
Spectrometers
Tuning
apertures
tuning
spectrometers
Defects
defects
radiation

Keywords

  • Near field
  • Short tip
  • Tapping mode
  • Transverse mode
  • Vertical-cavity surface-emitting laser

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Imaging near-field transverse modes of vertical-cavity surface-emitting lasers by near-field scanning optical microscopy. / Lu, Nien Hua; Chen, Chih Yen; Lin, Chin Sung; Liu, Wei Chih; Tsai, Din Ping.

In: Scanning, Vol. 26, No. 5 SUPPL., 2004.

Research output: Contribution to journalArticle

Lu, Nien Hua ; Chen, Chih Yen ; Lin, Chin Sung ; Liu, Wei Chih ; Tsai, Din Ping. / Imaging near-field transverse modes of vertical-cavity surface-emitting lasers by near-field scanning optical microscopy. In: Scanning. 2004 ; Vol. 26, No. 5 SUPPL.
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