Image-based system for measuring objects on an oblique surface

Chen-Chien James Hsu, Wei-Yen Wang, Yin Yu Lu, Ming Chi Lu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper presents an image-based framework for measuring target objects on an oblique plane by using a single CCD camera and two parallel laser projectors beside the camera. Because of the alignment of the laser beams which form in parallel with the optical axis, projected spots in the image can be processed to establish relationships between distance and pixel counts between the projected spots in the image. Based on simple geometrical derivations without complex image processing, the proposed approach can measure the photographing distance, the distance between two arbitrary points on the oblique surface, and the incline angle. Experiment results have demonstrated the effectiveness of the proposed approach in measuring distant objects on an oblique plane.

Original languageEnglish
Title of host publication2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings
Pages313-317
Number of pages5
DOIs
Publication statusPublished - 2010 Oct 18
Event2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Austin, TX, United States
Duration: 2010 May 32010 May 6

Publication series

Name2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

Other

Other2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010
CountryUnited States
CityAustin, TX
Period10/5/310/5/6

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Keywords

  • CCD images
  • Digital cameras
  • Distance measurement
  • Incline angle
  • Laser projectors
  • Measuring systems
  • Oblique plane
  • Pixels

ASJC Scopus subject areas

  • Instrumentation

Cite this

Hsu, C-C. J., Wang, W-Y., Lu, Y. Y., & Lu, M. C. (2010). Image-based system for measuring objects on an oblique surface. In 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings (pp. 313-317). [5488221] (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings). https://doi.org/10.1109/IMTC.2010.5488221