Identification of embedded charge defects in suspended silicon nanowires using a carbon-nanotube cantilever gate

Yann Wen Lan, Linh Nam Nguyen, Shui Jin Lai, Ming Chou Lin, Chieh Hsiung Kuan, Chii Dong Chen

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Abstract

A movable carbon nanotube (CNT) cantilever gate is developed for the detection of embedded charge defects in suspended nanowires. The CNT gate is composed of a gold probe welded to a thick CNT, which is in turn attached to a thinner CNT. The rigid welding of the thicker CNT to the gold probe allows for precise placement along the measured nanowire while the joint between the thinner and thicker CNT absorbs the push and pull forces of repeated relocation. For demonstration purpose, the CNT gate determines the site of the embedded charges and measures the amount of trapped electrons.

Original languageEnglish
Article number053104
JournalApplied Physics Letters
Volume99
Issue number5
DOIs
Publication statusPublished - 2011 Aug 1
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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