Hole distribution in YxPr1-xBa2Cu 4O8 and YxPr1-xBa2Cu 3O7 probed by X-ray absorption spectroscopy

J. M. Chen*, S. J. Liu, J. M. Lee, J. Y. Lin, Y. S. Gou, H. D. Yang

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

Utilizing high-resolution O K-edge X-ray absorption spectra, we report a comparative study on the variation of hole states with Pr doping for Y x Pr1-xBa2Cu3O7 and YxPr1-xBa2 Cu4 O8. The depletion rate of hole carriers in the CuO2 planes with Pr doping in YxPr1-xBa2Cu4 O8 is considerably slower than that in YxPr1-xBa 2Cu3O7. The oxygen content affects the depletion rate of hole carriers in cuprates with Pr doping.

Original languageEnglish
Pages (from-to)818-819
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume408-410
Issue number1-4
DOIs
Publication statusPublished - 2004 Aug
Externally publishedYes
EventProceedings of the International Conference on Materials - Rio de Janeiro, Brazil
Duration: 2003 May 252003 May 30

Keywords

  • Hole carriers
  • X-ray absorption spectra

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Hole distribution in YxPr1-xBa2Cu 4O8 and YxPr1-xBa2Cu 3O7 probed by X-ray absorption spectroscopy'. Together they form a unique fingerprint.

Cite this