Abstract
In this work, we studied a TiO2 mixed LaAlO3 dielectric (TLAO) for metal-insulator-metal (MIM) capacitors. The resulting capacitor characteristics showed a high capacitance density of 23.2 fF/μm2 and a low leakage current of 7.5 × 10-7 A/cm2 at -1 V. Comparing to the control samples of TiLaO (TLO), TLAO dielectrics with Al2O3 doping showed lower leakage current, smaller voltage nonlinearity and better time-dependent dielectric breakdown (TDDB) performance. Therefore, the TiO2-based dielectrics with the introduction of Al2O3 might be favorable for the improved engineering of MIM capacitors.
Original language | English |
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Pages (from-to) | 646-649 |
Number of pages | 4 |
Journal | Solid-State Electronics |
Volume | 54 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2010 Jun |
Externally published | Yes |
Keywords
- AlO
- LaAlO
- Metal-insulator-metal capacitor
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry