@inproceedings{1dbe1397b6f9419fb8b92313253b060d,
title = "High-voltage driving circuit with on-chip ESD protection in CMOS technology",
abstract = "A high-voltage/high-power driving circuit for the applicatrions such as a motor controller in robot is presented in this work. The driving circuit is further equipped with a novel electrostatic discharge (ESD) protection design to enhance its reliability. A 3×VDD-tolerant driving circuit with on-chip ESD protection is demonstrated using a 0.18 μm CMOS process with Vdd of 3.3V. The ESD robustness can be improved without the use of any additional ESD protection device or layout area. Furthermore, this design technique can be used for an nVdd-tolerant driving circuit with improved ESD robustness.",
keywords = "CMOS, driving circuit, electrostatic discharge (ESD), reliability",
author = "Lin, {Chun Yu} and Chiu, {Yan Lian}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2nd International Conference on Intelligent Informatics and Biomedical Sciences, ICIIBMS 2017 ; Conference date: 24-11-2017 Through 26-11-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/ICIIBMS.2017.8279758",
language = "English",
series = "ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "223--224",
booktitle = "ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences",
}