High-voltage driving circuit with on-chip ESD protection in CMOS technology

Chun Yu Lin, Yan Lian Chiu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A high-voltage/high-power driving circuit for the applicatrions such as a motor controller in robot is presented in this work. The driving circuit is further equipped with a novel electrostatic discharge (ESD) protection design to enhance its reliability. A 3×VDD-tolerant driving circuit with on-chip ESD protection is demonstrated using a 0.18 μm CMOS process with Vdd of 3.3V. The ESD robustness can be improved without the use of any additional ESD protection device or layout area. Furthermore, this design technique can be used for an nVdd-tolerant driving circuit with improved ESD robustness.

Original languageEnglish
Title of host publicationICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages223-224
Number of pages2
ISBN (Electronic)9781509066643
DOIs
Publication statusPublished - 2018 Feb 2
Event2nd International Conference on Intelligent Informatics and Biomedical Sciences, ICIIBMS 2017 - Okinawa, Japan
Duration: 2017 Nov 242017 Nov 26

Publication series

NameICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences
Volume2018-January

Conference

Conference2nd International Conference on Intelligent Informatics and Biomedical Sciences, ICIIBMS 2017
CountryJapan
CityOkinawa
Period17/11/2417/11/26

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Keywords

  • CMOS
  • driving circuit
  • electrostatic discharge (ESD)
  • reliability

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Information Systems
  • Biomedical Engineering
  • Safety, Risk, Reliability and Quality
  • Control and Optimization

Cite this

Lin, C. Y., & Chiu, Y. L. (2018). High-voltage driving circuit with on-chip ESD protection in CMOS technology. In ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences (pp. 223-224). (ICIIBMS 2017 - 2nd International Conference on Intelligent Informatics and Biomedical Sciences; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIIBMS.2017.8279758