High refractive index properties of oxyfluorosilicate glasses and a unified dielectric model of silicate oxide glasses in the sub-terahertz frequency region

Osamu Wada, Doddoji Ramachari, Chan Shan Yang, Takashi Uchino, Ci Ling Pan

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Dielectric properties of oxyfluorosilicate (OFS) glasses have been characterized using Terahertz (THz)-time domain spectroscopy in the sub-THz region as well as optical reflection measurement. OFS glass containing 20 mol% of Nb2O5, which is termed ZNbKLSNd glass, has the highest refractive index of 3.70 in the sub-THz region. The THz and optical refractive indices of various silicate oxide glasses, including OFS glasses, have been confirmed to be correlated by a unified relationship utilizing a parameter defined by the ratio of ionic to electronic polarizability. Additionally, the frequency dependence of the THz dielectric constant has been interpreted by a single oscillator model for all silicate oxide glasses including OFS glasses. On the basis of the present unified dielectric model, the very high refractive index of ZNbKLSNd glass has been attributed to the lowering of oscillator resonance wavelength originated from the incorporation of Nb2O5 intermediate network former.

Original languageEnglish
Pages (from-to)607-621
Number of pages15
JournalOptical Materials Express
Volume10
Issue number2
DOIs
Publication statusPublished - 2020 Feb 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint

Dive into the research topics of 'High refractive index properties of oxyfluorosilicate glasses and a unified dielectric model of silicate oxide glasses in the sub-terahertz frequency region'. Together they form a unique fingerprint.

Cite this