High quality step-edge substrates for high- Tc superconducting devices

C. H. Wu, M. J. Chen, J. C. Chen, K. L. Chen, Hong-Chang Yang, M. S. Hsu, T. S. Lai, Y. S. Tsai, Herng-Er Horng, J. H. Chen, J. T. Jeng

    Research output: Contribution to journalArticle

    10 Citations (Scopus)

    Abstract

    Despite the significant progress in fabrication methods of step edge, the lack of reproducibility still hinders their use in more complicated systems. To pursue the high reproducibility and quality of step edge for high- Tc superconducting devices, we have developed the technique to fabricate high quality step-edge substrates with arbitrary step angles. We used two steps to improve the step ramp quality substantially. The surface microscopy of step substrates shows high uniformity with respect to any step angle. There are no needles, waves, trenches, cascades, or other flaws on these surfaces. Serial Josephson junctions and superconducting quantum interference device arrays were fabricated onto step-edge substrates. The step-edge devices exhibit excellent results.

    Original languageEnglish
    Article number033901
    JournalReview of Scientific Instruments
    Volume77
    Issue number3
    DOIs
    Publication statusPublished - 2006 Mar 1

    Fingerprint

    Superconducting devices
    superconducting devices
    Substrates
    SQUIDs
    Needles
    Microscopic examination
    Fabrication
    Defects
    ramps
    needles
    Josephson junctions
    cascades

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Wu, C. H., Chen, M. J., Chen, J. C., Chen, K. L., Yang, H-C., Hsu, M. S., ... Jeng, J. T. (2006). High quality step-edge substrates for high- Tc superconducting devices. Review of Scientific Instruments, 77(3), [033901]. https://doi.org/10.1063/1.2179407

    High quality step-edge substrates for high- Tc superconducting devices. / Wu, C. H.; Chen, M. J.; Chen, J. C.; Chen, K. L.; Yang, Hong-Chang; Hsu, M. S.; Lai, T. S.; Tsai, Y. S.; Horng, Herng-Er; Chen, J. H.; Jeng, J. T.

    In: Review of Scientific Instruments, Vol. 77, No. 3, 033901, 01.03.2006.

    Research output: Contribution to journalArticle

    Wu, CH, Chen, MJ, Chen, JC, Chen, KL, Yang, H-C, Hsu, MS, Lai, TS, Tsai, YS, Horng, H-E, Chen, JH & Jeng, JT 2006, 'High quality step-edge substrates for high- Tc superconducting devices', Review of Scientific Instruments, vol. 77, no. 3, 033901. https://doi.org/10.1063/1.2179407
    Wu, C. H. ; Chen, M. J. ; Chen, J. C. ; Chen, K. L. ; Yang, Hong-Chang ; Hsu, M. S. ; Lai, T. S. ; Tsai, Y. S. ; Horng, Herng-Er ; Chen, J. H. ; Jeng, J. T. / High quality step-edge substrates for high- Tc superconducting devices. In: Review of Scientific Instruments. 2006 ; Vol. 77, No. 3.
    @article{7f84f2e3c9834432a1fd00aca919a736,
    title = "High quality step-edge substrates for high- Tc superconducting devices",
    abstract = "Despite the significant progress in fabrication methods of step edge, the lack of reproducibility still hinders their use in more complicated systems. To pursue the high reproducibility and quality of step edge for high- Tc superconducting devices, we have developed the technique to fabricate high quality step-edge substrates with arbitrary step angles. We used two steps to improve the step ramp quality substantially. The surface microscopy of step substrates shows high uniformity with respect to any step angle. There are no needles, waves, trenches, cascades, or other flaws on these surfaces. Serial Josephson junctions and superconducting quantum interference device arrays were fabricated onto step-edge substrates. The step-edge devices exhibit excellent results.",
    author = "Wu, {C. H.} and Chen, {M. J.} and Chen, {J. C.} and Chen, {K. L.} and Hong-Chang Yang and Hsu, {M. S.} and Lai, {T. S.} and Tsai, {Y. S.} and Herng-Er Horng and Chen, {J. H.} and Jeng, {J. T.}",
    year = "2006",
    month = "3",
    day = "1",
    doi = "10.1063/1.2179407",
    language = "English",
    volume = "77",
    journal = "Review of Scientific Instruments",
    issn = "0034-6748",
    publisher = "American Institute of Physics Publising LLC",
    number = "3",

    }

    TY - JOUR

    T1 - High quality step-edge substrates for high- Tc superconducting devices

    AU - Wu, C. H.

    AU - Chen, M. J.

    AU - Chen, J. C.

    AU - Chen, K. L.

    AU - Yang, Hong-Chang

    AU - Hsu, M. S.

    AU - Lai, T. S.

    AU - Tsai, Y. S.

    AU - Horng, Herng-Er

    AU - Chen, J. H.

    AU - Jeng, J. T.

    PY - 2006/3/1

    Y1 - 2006/3/1

    N2 - Despite the significant progress in fabrication methods of step edge, the lack of reproducibility still hinders their use in more complicated systems. To pursue the high reproducibility and quality of step edge for high- Tc superconducting devices, we have developed the technique to fabricate high quality step-edge substrates with arbitrary step angles. We used two steps to improve the step ramp quality substantially. The surface microscopy of step substrates shows high uniformity with respect to any step angle. There are no needles, waves, trenches, cascades, or other flaws on these surfaces. Serial Josephson junctions and superconducting quantum interference device arrays were fabricated onto step-edge substrates. The step-edge devices exhibit excellent results.

    AB - Despite the significant progress in fabrication methods of step edge, the lack of reproducibility still hinders their use in more complicated systems. To pursue the high reproducibility and quality of step edge for high- Tc superconducting devices, we have developed the technique to fabricate high quality step-edge substrates with arbitrary step angles. We used two steps to improve the step ramp quality substantially. The surface microscopy of step substrates shows high uniformity with respect to any step angle. There are no needles, waves, trenches, cascades, or other flaws on these surfaces. Serial Josephson junctions and superconducting quantum interference device arrays were fabricated onto step-edge substrates. The step-edge devices exhibit excellent results.

    UR - http://www.scopus.com/inward/record.url?scp=33645894173&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=33645894173&partnerID=8YFLogxK

    U2 - 10.1063/1.2179407

    DO - 10.1063/1.2179407

    M3 - Article

    VL - 77

    JO - Review of Scientific Instruments

    JF - Review of Scientific Instruments

    SN - 0034-6748

    IS - 3

    M1 - 033901

    ER -