TY - GEN
T1 - High-accuracy and cost-effective photodiode spectral response measurement system
AU - Chang, Gao Wei
AU - Liao, Chia Cheng
AU - Yeh, Zong Mu
PY - 2007
Y1 - 2007
N2 - With the rapid growth of optoelectronics technologies, photodiodes (PDs) has been widely used in optical measurement systems, color measurement and analysis systems, etc. To meet most of the measurement requirements, the determination of PD spectral responses is very important. The goal of this paper is to develop a high-accuracy and cost-effective spectral response measurement system for PDs. In this paper, the proposed system contains a grating-based spectral filtering module, an amplifier module, and a digital-signal-processing (DSP) based platform. In the spectral filtering module, a single-grating monochromator based on a Czerny-Turner configuration is first analyzed and simulated, and then the experiments are conducted to check if the measurement accuracy is satisfactory. In the measurement system, optoelectronic signals from the PD under test are acquired from the amplifier module and the DSP-based platform is developed to communicate and manipulate the measured data. Through comparison with the measurement data from a commercially available system, it is found that our approach gives quite satisfactory results.
AB - With the rapid growth of optoelectronics technologies, photodiodes (PDs) has been widely used in optical measurement systems, color measurement and analysis systems, etc. To meet most of the measurement requirements, the determination of PD spectral responses is very important. The goal of this paper is to develop a high-accuracy and cost-effective spectral response measurement system for PDs. In this paper, the proposed system contains a grating-based spectral filtering module, an amplifier module, and a digital-signal-processing (DSP) based platform. In the spectral filtering module, a single-grating monochromator based on a Czerny-Turner configuration is first analyzed and simulated, and then the experiments are conducted to check if the measurement accuracy is satisfactory. In the measurement system, optoelectronic signals from the PD under test are acquired from the amplifier module and the DSP-based platform is developed to communicate and manipulate the measured data. Through comparison with the measurement data from a commercially available system, it is found that our approach gives quite satisfactory results.
KW - Digital signal processing
KW - Photodiode
KW - Spectral response
UR - http://www.scopus.com/inward/record.url?scp=34248634309&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34248634309&partnerID=8YFLogxK
U2 - 10.1117/12.701656
DO - 10.1117/12.701656
M3 - Conference contribution
AN - SCOPUS:34248634309
SN - 0819465844
SN - 9780819465849
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
T2 - Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
Y2 - 22 January 2007 through 24 January 2007
ER -