High-accuracy and cost-effective photodiode spectral response measurement system

Gao-Wei Chang, Chia Cheng Liao, Zong-Mu Yeh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the rapid growth of optoelectronics technologies, photodiodes (PDs) has been widely used in optical measurement systems, color measurement and analysis systems, etc. To meet most of the measurement requirements, the determination of PD spectral responses is very important. The goal of this paper is to develop a high-accuracy and cost-effective spectral response measurement system for PDs. In this paper, the proposed system contains a grating-based spectral filtering module, an amplifier module, and a digital-signal-processing (DSP) based platform. In the spectral filtering module, a single-grating monochromator based on a Czerny-Turner configuration is first analyzed and simulated, and then the experiments are conducted to check if the measurement accuracy is satisfactory. In the measurement system, optoelectronic signals from the PD under test are acquired from the amplifier module and the DSP-based platform is developed to communicate and manipulate the measured data. Through comparison with the measurement data from a commercially available system, it is found that our approach gives quite satisfactory results.

Original languageEnglish
Title of host publicationUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
DOIs
Publication statusPublished - 2007 May 24
EventUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV - San Jose, CA, United States
Duration: 2007 Jan 222007 Jan 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6471
ISSN (Print)0277-786X

Other

OtherUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
CountryUnited States
CitySan Jose, CA
Period07/1/2207/1/24

Fingerprint

Photodiodes
spectral sensitivity
photodiodes
costs
modules
Costs
Digital signal processing
Optoelectronic devices
signal processing
platforms
amplifiers
gratings
Monochromators
systems analysis
monochromators
optical measurement
Color
color
requirements
configurations

Keywords

  • Digital signal processing
  • Photodiode
  • Spectral response

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Chang, G-W., Liao, C. C., & Yeh, Z-M. (2007). High-accuracy and cost-effective photodiode spectral response measurement system. In Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV [647117] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6471). https://doi.org/10.1117/12.701656

High-accuracy and cost-effective photodiode spectral response measurement system. / Chang, Gao-Wei; Liao, Chia Cheng; Yeh, Zong-Mu.

Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV. 2007. 647117 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6471).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chang, G-W, Liao, CC & Yeh, Z-M 2007, High-accuracy and cost-effective photodiode spectral response measurement system. in Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV., 647117, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6471, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV, San Jose, CA, United States, 07/1/22. https://doi.org/10.1117/12.701656
Chang G-W, Liao CC, Yeh Z-M. High-accuracy and cost-effective photodiode spectral response measurement system. In Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV. 2007. 647117. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.701656
Chang, Gao-Wei ; Liao, Chia Cheng ; Yeh, Zong-Mu. / High-accuracy and cost-effective photodiode spectral response measurement system. Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV. 2007. (Proceedings of SPIE - The International Society for Optical Engineering).
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