Skip to main navigation Skip to search Skip to main content

Growth of strained Si on high-quality relaxed Si1-x Gex with an intermediate Si1-y Cy layer

  • S. W. Lee*
  • , Y. L. Chueh
  • , L. J. Chen
  • , L. J. Chou
  • , P. S. Chen
  • , M. H. Lee
  • , M. J. Tsai
  • , C. W. Liu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Growth of strained Si on high-quality relaxed Si1-x Gex with an intermediate Si1-y Cy layer'. Together they form a unique fingerprint.
Sort by

INIS

Material Science