Growth and characterization of La0.7Sr0.3MnO 3 films on various substrates

S. Y. Yang; W. L. Kuang; Y. Liou; W. S. Tse; S. F. Lee; Y. D. Yao

doi:10.1016/S0304-8853(03)00543-2

Growth and characterization of La_0.7Sr_0.3MnO ₃ films on various substrates

S. Y. Yang^*, W. L. Kuang, Y. Liou, W. S. Tse, S. F. Lee, Y. D. Yao

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Article › peer-review

87 Citations (Scopus)

Abstract

The manganite La_0.7Sr_0.3MnO₃ (LSMO) films are deposited on various substrates, such as single crystal LaAlO ₃(001), SrTiO₃(001), MgO(001), SiO₂/Si(001) and amorphous quartz, by using a magnetron DC sputtering system. According to the X-ray diffraction patterns, either the c-axis oriented or the polycrystalline LSMO films are obtained as the LSMO films are deposited on these substrates, depending on the lattice mismatch between the LSMO and the substrates. The c-axis oriented LSMO films exhibit typical transport properties, whereas the polycrystalline LSMO films show significantly different behaviors of the temperature-dependent resistance, and the magnetoresistance. This work provides characterizations of the LSMO films on several substrates for further applications integrated with other thin-film devices which are grown on different substrates.

Original language	English
Pages (from-to)	326-331
Number of pages	6
Journal	Journal of Magnetism and Magnetic Materials
Volume	268
Issue number	3
DOIs	https://doi.org/10.1016/S0304-8853(03)00543-2
Publication status	Published - 2004 Jan

Keywords

Lattice mismatch
Magnetoresistance
Manganite
Polycrystalline

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/S0304-8853(03)00543-2

Cite this

@article{bae1db2456954695b60aa48d6915fbaa,

title = "Growth and characterization of La0.7Sr0.3MnO 3 films on various substrates",

abstract = "The manganite La0.7Sr0.3MnO3 (LSMO) films are deposited on various substrates, such as single crystal LaAlO 3(001), SrTiO3(001), MgO(001), SiO2/Si(001) and amorphous quartz, by using a magnetron DC sputtering system. According to the X-ray diffraction patterns, either the c-axis oriented or the polycrystalline LSMO films are obtained as the LSMO films are deposited on these substrates, depending on the lattice mismatch between the LSMO and the substrates. The c-axis oriented LSMO films exhibit typical transport properties, whereas the polycrystalline LSMO films show significantly different behaviors of the temperature-dependent resistance, and the magnetoresistance. This work provides characterizations of the LSMO films on several substrates for further applications integrated with other thin-film devices which are grown on different substrates.",

keywords = "Lattice mismatch, Magnetoresistance, Manganite, Polycrystalline",

author = "Yang, {S. Y.} and Kuang, {W. L.} and Y. Liou and Tse, {W. S.} and Lee, {S. F.} and Yao, {Y. D.}",

year = "2004",

month = jan,

doi = "10.1016/S0304-8853(03)00543-2",

language = "English",

volume = "268",

pages = "326--331",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

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TY - JOUR

T1 - Growth and characterization of La0.7Sr0.3MnO 3 films on various substrates

AU - Yang, S. Y.

AU - Kuang, W. L.

AU - Liou, Y.

AU - Tse, W. S.

AU - Lee, S. F.

AU - Yao, Y. D.

PY - 2004/1

Y1 - 2004/1

N2 - The manganite La0.7Sr0.3MnO3 (LSMO) films are deposited on various substrates, such as single crystal LaAlO 3(001), SrTiO3(001), MgO(001), SiO2/Si(001) and amorphous quartz, by using a magnetron DC sputtering system. According to the X-ray diffraction patterns, either the c-axis oriented or the polycrystalline LSMO films are obtained as the LSMO films are deposited on these substrates, depending on the lattice mismatch between the LSMO and the substrates. The c-axis oriented LSMO films exhibit typical transport properties, whereas the polycrystalline LSMO films show significantly different behaviors of the temperature-dependent resistance, and the magnetoresistance. This work provides characterizations of the LSMO films on several substrates for further applications integrated with other thin-film devices which are grown on different substrates.

AB - The manganite La0.7Sr0.3MnO3 (LSMO) films are deposited on various substrates, such as single crystal LaAlO 3(001), SrTiO3(001), MgO(001), SiO2/Si(001) and amorphous quartz, by using a magnetron DC sputtering system. According to the X-ray diffraction patterns, either the c-axis oriented or the polycrystalline LSMO films are obtained as the LSMO films are deposited on these substrates, depending on the lattice mismatch between the LSMO and the substrates. The c-axis oriented LSMO films exhibit typical transport properties, whereas the polycrystalline LSMO films show significantly different behaviors of the temperature-dependent resistance, and the magnetoresistance. This work provides characterizations of the LSMO films on several substrates for further applications integrated with other thin-film devices which are grown on different substrates.

KW - Lattice mismatch

KW - Magnetoresistance

KW - Manganite

KW - Polycrystalline

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