Flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions

J. T. Jeng, H. C. Hung, C. R. Lin, C. H. Wu, K. L. Chen, J. C. Chen, Hong-Chang Yang, Shu-Hsien Liao, Herng-Er Horng

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)

    Abstract

    The factors affecting the flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions were investigated. By using the proposed critical-current-modulation model, it is found that the voltage swing of the series-SQUID array is suppressed greatly by the spread in critical currents of Josephson junctions. For the inductance L = 80 pH and the logarithmic average critical current 2 Iave = 20 μA. of the component SQUID, the allowed spread in critical currents of Josephson junctions is 0.4 Iave to 2.2 Iave for achieving the low flux noise with the series SQUID array.

    Original languageEnglish
    Pages (from-to)793-796
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Volume15
    Issue number2 PART I
    DOIs
    Publication statusPublished - 2005 Jun 1

    Keywords

    • Critical-current spread
    • High-temperature superconductors
    • Josephson junctions
    • SQUID

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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