Flux-flow Hall coefficient in YBa2Cu3Oy films with proton irradiation

H. E. Horng; C. S. Chen; L. M. Wang; H. M. Cho; C. Y. Huang; H. C. Yang; Y. C. Liu

doi:10.1016/0921-4534(94)92609-3

Flux-flow Hall coefficient in YBa₂Cu₃O_y films with proton irradiation

H. E. Horng^*, C. S. Chen, L. M. Wang, H. M. Cho, C. Y. Huang, H. C. Yang, Y. C. Liu

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We have measured magnetic hysteresis loops, Hall coefficients R_H and resistivities of YBa₂Cu₃O_y(YBCO) films with and without H⁺ irradiation to examine the effects of H⁺ irradiation on Hall coefficients. The fluence, φ{symbol}t, was up to 3×10¹³ cm^-2 the incident energy of H⁺-ions was 3 MeV. Negative Hall coefficients and the pinning energy of YBCO films were affected by H⁺ irradiation. The results are presented.

Original language	English
Pages (from-to)	2777-2778
Number of pages	2
Journal	Physica C: Superconductivity and its applications
Volume	235-240
Issue number	PART 4
DOIs	https://doi.org/10.1016/0921-4534(94)92609-3
Publication status	Published - 1994 Dec

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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@article{d2bf76eaa9864cc9865fbc0762d5fa2a,

title = "Flux-flow Hall coefficient in YBa2Cu3Oy films with proton irradiation",

abstract = "We have measured magnetic hysteresis loops, Hall coefficients RH and resistivities of YBa2Cu3Oy(YBCO) films with and without H+ irradiation to examine the effects of H+ irradiation on Hall coefficients. The fluence, φ{symbol}t, was up to 3×1013 cm-2 the incident energy of H+-ions was 3 MeV. Negative Hall coefficients and the pinning energy of YBCO films were affected by H+ irradiation. The results are presented.",

author = "Horng, {H. E.} and Chen, {C. S.} and Wang, {L. M.} and Cho, {H. M.} and Huang, {C. Y.} and Yang, {H. C.} and Liu, {Y. C.}",

year = "1994",

month = dec,

doi = "10.1016/0921-4534(94)92609-3",

language = "English",

volume = "235-240",

pages = "2777--2778",

journal = "Physica C: Superconductivity and its applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "PART 4",

}

TY - JOUR

T1 - Flux-flow Hall coefficient in YBa2Cu3Oy films with proton irradiation

AU - Horng, H. E.

AU - Chen, C. S.

AU - Wang, L. M.

AU - Cho, H. M.

AU - Huang, C. Y.

AU - Yang, H. C.

AU - Liu, Y. C.

PY - 1994/12

Y1 - 1994/12

N2 - We have measured magnetic hysteresis loops, Hall coefficients RH and resistivities of YBa2Cu3Oy(YBCO) films with and without H+ irradiation to examine the effects of H+ irradiation on Hall coefficients. The fluence, φ{symbol}t, was up to 3×1013 cm-2 the incident energy of H+-ions was 3 MeV. Negative Hall coefficients and the pinning energy of YBCO films were affected by H+ irradiation. The results are presented.

AB - We have measured magnetic hysteresis loops, Hall coefficients RH and resistivities of YBa2Cu3Oy(YBCO) films with and without H+ irradiation to examine the effects of H+ irradiation on Hall coefficients. The fluence, φ{symbol}t, was up to 3×1013 cm-2 the incident energy of H+-ions was 3 MeV. Negative Hall coefficients and the pinning energy of YBCO films were affected by H+ irradiation. The results are presented.

UR - http://www.scopus.com/inward/record.url?scp=43949160580&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=43949160580&partnerID=8YFLogxK

U2 - 10.1016/0921-4534(94)92609-3

DO - 10.1016/0921-4534(94)92609-3

M3 - Article

AN - SCOPUS:43949160580

SN - 0921-4534

VL - 235-240

SP - 2777

EP - 2778

JO - Physica C: Superconductivity and its applications

JF - Physica C: Superconductivity and its applications

IS - PART 4

ER -

Flux-flow Hall coefficient in YBa₂Cu₃O_y films with proton irradiation

Abstract

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