File access extension of test code generation tool for Java programming learning assistant system

Nobuo Funabiki, Ryota Kusaka, Nobuya Ishihara, Wen Chung Kao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To advance Java programming studies, we have developed the Java Programming Learning Assistant System (JPLAS). The test code plays a critical role in verifying the correctness of the source code from a student automatically at the server in the code writing problem in JPLAS. Previously, we proposed the test code generation tool that automatically generates the test code from the given source code containing standard inputs/outputs that novice students are expected to study in advance. In this paper, we extend this tool to handle the source code with file inputs/outputs. By applying the extended tool to three codes containing file inputs/outputs, the correctness of the generated test codes is confirmed.

Original languageEnglish
Title of host publication2017 IEEE 6th Global Conference on Consumer Electronics, GCCE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-2
Number of pages2
ISBN (Electronic)9781509040452
DOIs
Publication statusPublished - 2017 Dec 19
Event6th IEEE Global Conference on Consumer Electronics, GCCE 2017 - Nagoya, Japan
Duration: 2017 Oct 242017 Oct 27

Publication series

Name2017 IEEE 6th Global Conference on Consumer Electronics, GCCE 2017
Volume2017-January

Other

Other6th IEEE Global Conference on Consumer Electronics, GCCE 2017
CountryJapan
CityNagoya
Period17/10/2417/10/27

ASJC Scopus subject areas

  • Media Technology
  • Instrumentation
  • Electrical and Electronic Engineering

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    Funabiki, N., Kusaka, R., Ishihara, N., & Kao, W. C. (2017). File access extension of test code generation tool for Java programming learning assistant system. In 2017 IEEE 6th Global Conference on Consumer Electronics, GCCE 2017 (pp. 1-2). (2017 IEEE 6th Global Conference on Consumer Electronics, GCCE 2017; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/GCCE.2017.8229400