Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward Endurance Immunity by Opposite Polarity Cycling Recovery (OPCR) for eDRAM

K. Y. Hsiang, J. Y. Lee, Z. F. Lou, F. S. Chang, Y. C. Chen, Z. X. Li, M. H. Liao, C. W. Liu, T. H. Hou, P. Su, M. H. Lee*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

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