Far-IR reflectance spectra analysis of CdZnTe and related materials

Tzuen-Rong Yang, Sheng Hong Jhang, Yen Hao Shih, Fu Chung Hou, Yu Chang Yang, P. Becla, Der Chi Tien, Zhe Chuan Feng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm-1 to 145 cm-1. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm-1 to 181 cm-1. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZnxTe1-x increase with increasing of x value and the conductivity of CdSe xTe1-x decrease with increasing of x value.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
DOIs
Publication statusPublished - 2009 Dec 11
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - San Diego, CA, United States
Duration: 2009 Aug 32009 Aug 6

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7449
ISSN (Print)0277-786X

Other

OtherHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
CountryUnited States
CitySan Diego, CA
Period09/8/309/8/6

Fingerprint

CdZnTe
Spectrum Analysis
Reflectance
Spectrum analysis
spectrum analysis
Infrared radiation
reflectance
Conductivity
Ternary alloys
Infrared
Phonons
CdTe
Optical properties
Single crystals
Spectroscopy
Single Crystal
Ternary
Wafer
conductivity
Optical Properties

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Yang, T-R., Jhang, S. H., Shih, Y. H., Hou, F. C., Yang, Y. C., Becla, P., ... Feng, Z. C. (2009). Far-IR reflectance spectra analysis of CdZnTe and related materials. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI [74490L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7449). https://doi.org/10.1117/12.825874

Far-IR reflectance spectra analysis of CdZnTe and related materials. / Yang, Tzuen-Rong; Jhang, Sheng Hong; Shih, Yen Hao; Hou, Fu Chung; Yang, Yu Chang; Becla, P.; Tien, Der Chi; Feng, Zhe Chuan.

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. 74490L (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7449).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yang, T-R, Jhang, SH, Shih, YH, Hou, FC, Yang, YC, Becla, P, Tien, DC & Feng, ZC 2009, Far-IR reflectance spectra analysis of CdZnTe and related materials. in Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI., 74490L, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, San Diego, CA, United States, 09/8/3. https://doi.org/10.1117/12.825874
Yang T-R, Jhang SH, Shih YH, Hou FC, Yang YC, Becla P et al. Far-IR reflectance spectra analysis of CdZnTe and related materials. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. 74490L. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.825874
Yang, Tzuen-Rong ; Jhang, Sheng Hong ; Shih, Yen Hao ; Hou, Fu Chung ; Yang, Yu Chang ; Becla, P. ; Tien, Der Chi ; Feng, Zhe Chuan. / Far-IR reflectance spectra analysis of CdZnTe and related materials. Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. (Proceedings of SPIE - The International Society for Optical Engineering).
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AU - Becla, P.

AU - Tien, Der Chi

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