TY - GEN
T1 - Fabrication of ultra-sharp single atom tips
AU - Fu, Tsu Yi
AU - Chiang, Chia Lun
AU - Lin, Rung Jiun
AU - Hou, Jin Long
AU - Kuo, Hong Shi
AU - Hwang, Ing Shouh
AU - Tsong, Tien T.
PY - 2010
Y1 - 2010
N2 - Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.
AB - Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.
UR - http://www.scopus.com/inward/record.url?scp=77951656356&partnerID=8YFLogxK
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U2 - 10.1109/INEC.2010.5424585
DO - 10.1109/INEC.2010.5424585
M3 - Conference contribution
AN - SCOPUS:77951656356
SN - 9781424435449
T3 - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
SP - 142
EP - 143
BT - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
T2 - 2010 3rd International Nanoelectronics Conference, INEC 2010
Y2 - 3 January 2010 through 8 January 2010
ER -