Fabrication of ultra-sharp single atom tips

Tsu-Yi Fu, Chia Lun Chiang, Rung Jiun Lin, Jin Long Hou, Hong Shi Kuo, Ing Shouh Hwang, Tien T. Tsong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.

Original languageEnglish
Title of host publicationINEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
Pages142-143
Number of pages2
DOIs
Publication statusPublished - 2010 May 5
Event2010 3rd International Nanoelectronics Conference, INEC 2010 - Hongkong, China
Duration: 2010 Jan 3 → 2010 Jan 8

Other

Other2010 3rd International Nanoelectronics Conference, INEC 2010
CountryChina
CityHongkong
Period10/1/3 → 10/1/8

Fingerprint

Ion microscopes
Ultrahigh vacuum
Epitaxial growth
Microscopic examination
Annealing
Fabrication
Atoms
Ions
Gases

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Fu, T-Y., Chiang, C. L., Lin, R. J., Hou, J. L., Kuo, H. S., Hwang, I. S., & Tsong, T. T. (2010). Fabrication of ultra-sharp single atom tips. In INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings (pp. 142-143). [5424585] https://doi.org/10.1109/INEC.2010.5424585

Fabrication of ultra-sharp single atom tips. / Fu, Tsu-Yi; Chiang, Chia Lun; Lin, Rung Jiun; Hou, Jin Long; Kuo, Hong Shi; Hwang, Ing Shouh; Tsong, Tien T.

INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. 2010. p. 142-143 5424585.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fu, T-Y, Chiang, CL, Lin, RJ, Hou, JL, Kuo, HS, Hwang, IS & Tsong, TT 2010, Fabrication of ultra-sharp single atom tips. in INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings., 5424585, pp. 142-143, 2010 3rd International Nanoelectronics Conference, INEC 2010, Hongkong, China, 10/1/3. https://doi.org/10.1109/INEC.2010.5424585
Fu T-Y, Chiang CL, Lin RJ, Hou JL, Kuo HS, Hwang IS et al. Fabrication of ultra-sharp single atom tips. In INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. 2010. p. 142-143. 5424585 https://doi.org/10.1109/INEC.2010.5424585
Fu, Tsu-Yi ; Chiang, Chia Lun ; Lin, Rung Jiun ; Hou, Jin Long ; Kuo, Hong Shi ; Hwang, Ing Shouh ; Tsong, Tien T. / Fabrication of ultra-sharp single atom tips. INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. 2010. pp. 142-143
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