Fabrication of ultra-sharp single atom tips

Tsu-Yi Fu, Chia Lun Chiang, Rung Jiun Lin, Jin Long Hou, Hong Shi Kuo, Ing Shouh Hwang, Tien T. Tsong

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.

Original languageEnglish
Title of host publicationINEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
Number of pages2
Publication statusPublished - 2010 May 5
Event2010 3rd International Nanoelectronics Conference, INEC 2010 - Hongkong, China
Duration: 2010 Jan 32010 Jan 8


Other2010 3rd International Nanoelectronics Conference, INEC 2010

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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