Skip to main navigation
Skip to search
Skip to main content
National Taiwan Normal University Home
Help & FAQ
English
中文
Home
Profiles
Research units
Research output
Projects
Press/Media
Datasets
Activities
Prizes
Student theses
Search by expertise, name or affiliation
Fabrication and low temperature thermoelectric properties of Na
x
CoO
2
(x=0.68 and 0.75) epitaxial films by the reactive solid-phase epitaxy
W. J. Chang
*
, C. C. Hsieh
, T. Y. Chung
, S. Y. Hsu
, K. H. Wu
, T. M. Uen
, J. Y. Lin
, J. J. Lin
, C. H. Hsu
, Y. K. Kuo
,
H. L. Liu
, M. H. Hsu
, Y. S. Gou
, J. Y. Juang
*
Corresponding author for this work
Department of Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
14
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Fabrication and low temperature thermoelectric properties of Na
x
CoO
2
(x=0.68 and 0.75) epitaxial films by the reactive solid-phase epitaxy'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
INIS
films
100%
low temperature
100%
fabrication
100%
solids
100%
epitaxy
100%
thermoelectric properties
100%
sodium
60%
thin films
60%
oxygen
40%
control
20%
environment
20%
power
20%
growth
20%
diffusion
20%
x-ray diffraction
20%
scattering
20%
single crystals
20%
quasi particles
20%
thermal diffusion
20%
Material Science
Sodium
100%
Thermoelectrics
100%
Solid Phase Epitaxy
100%
Thin Films
100%
Epitaxial Film
100%
Film
33%
Epitaxy
33%
Electrical Resistivity
33%
Thermal Diffusion
33%
Single Crystal
33%
Crystalline Material
33%