Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

Mei Yu Chen, P. J. Chang, C. T. Chia*, Y. C. Lee, I. N. Lin, L. J. Lin, J. F. Lee, H. Y. Lee, T. Shimada

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.

Original languageEnglish
Pages (from-to)2995-2999
Number of pages5
JournalJournal of the European Ceramic Society
Issue number8-9 SPEC. ISS.
Publication statusPublished - 2007


  • Extended X-ray absorption fine structure (EXAFS)

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry


Dive into the research topics of 'Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3'. Together they form a unique fingerprint.

Cite this