Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

Mei Yu Chen; P. J. Chang; C. T. Chia; Y. C. Lee; I. N. Lin; L. J. Lin; J. F. Lee; H. Y. Lee; T. Shimada

doi:10.1016/j.jeurceramsoc.2006.11.025

Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg_1/3Ta_2/3)O₃

Mei Yu Chen, P. J. Chang, C. T. Chia^*, Y. C. Lee, I. N. Lin, L. J. Lin, J. F. Lee, H. Y. Lee, T. Shimada

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni_1/3Ta_2/3)O₃ + (1 - x)Ba(Mg_1/3Ta_2/3)O₃ samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO₆ octahedra, that is A_1g(O) phonon near 800 cm^-1, are strongly correlated to the microwave properties of xBa(Ni_1/3Mg_2/3)O₃ + (1 - x)Ba(Mg_1/3Ta_2/3)O₃ samples. The large Raman shift and the large width of the A_1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg_1/3Ta_2/3)O₃ ceramic.

Original language	English
Pages (from-to)	2995-2999
Number of pages	5
Journal	Journal of the European Ceramic Society
Volume	27
Issue number	8-9 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2006.11.025
Publication status	Published - 2007

Keywords

Extended X-ray absorption fine structure (EXAFS)

ASJC Scopus subject areas

Ceramics and Composites
Materials Chemistry

Access to Document

10.1016/j.jeurceramsoc.2006.11.025

Cite this

@article{dcb279c3edfc4585bf74deb10a371310,

title = "Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3",

abstract = "Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.",

keywords = "Extended X-ray absorption fine structure (EXAFS)",

author = "Chen, {Mei Yu} and Chang, {P. J.} and Chia, {C. T.} and Lee, {Y. C.} and Lin, {I. N.} and Lin, {L. J.} and Lee, {J. F.} and Lee, {H. Y.} and T. Shimada",

note = "Funding Information: Financial support of this work from the National Science Council of Taiwan, ROC, under the Contract Nos. NSC 94-2112-M-003-007 and NSC 93-2112-M-003-012 is acknowledged.",

year = "2007",

doi = "10.1016/j.jeurceramsoc.2006.11.025",

language = "English",

volume = "27",

pages = "2995--2999",

journal = "Journal of the European Ceramic Society",

issn = "0955-2219",

publisher = "Elsevier BV",

number = "8-9 SPEC. ISS.",

}

TY - JOUR

T1 - Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

AU - Chen, Mei Yu

AU - Chang, P. J.

AU - Chia, C. T.

AU - Lee, Y. C.

AU - Lin, I. N.

AU - Lin, L. J.

AU - Lee, J. F.

AU - Lee, H. Y.

AU - Shimada, T.

N1 - Funding Information: Financial support of this work from the National Science Council of Taiwan, ROC, under the Contract Nos. NSC 94-2112-M-003-007 and NSC 93-2112-M-003-012 is acknowledged.

PY - 2007

Y1 - 2007

N2 - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.

AB - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.

KW - Extended X-ray absorption fine structure (EXAFS)

UR - http://www.scopus.com/inward/record.url?scp=33947710798&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33947710798&partnerID=8YFLogxK

U2 - 10.1016/j.jeurceramsoc.2006.11.025

DO - 10.1016/j.jeurceramsoc.2006.11.025

M3 - Article

AN - SCOPUS:33947710798

SN - 0955-2219

VL - 27

SP - 2995

EP - 2999

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

IS - 8-9 SPEC. ISS.

ER -