Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg 1/3 Ta 2/3 )O 3

Mei Yu Chen, P. J. Chang, Chi-Ta Chia, Y. C. Lee, I. N. Lin, L. J. Lin, J. F. Lee, H. Y. Lee, T. Shimada

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni 1/3 Ta 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO 6 octahedra, that is A 1g (O) phonon near 800 cm -1 , are strongly correlated to the microwave properties of xBa(Ni 1/3 Mg 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples. The large Raman shift and the large width of the A 1g (O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg 1/3 Ta 2/3 )O 3 ceramic.

Original languageEnglish
Pages (from-to)2995-2999
Number of pages5
JournalJournal of the European Ceramic Society
Volume27
Issue number8-9 SPEC. ISS.
DOIs
Publication statusPublished - 2007 Apr 2

Fingerprint

X ray absorption
Nickel
X ray diffraction
Microwaves
Permittivity
Doping (additives)
Stretching
Oxygen
single bond

Keywords

  • Extended X-ray absorption fine structure (EXAFS)

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg 1/3 Ta 2/3 )O 3 . / Chen, Mei Yu; Chang, P. J.; Chia, Chi-Ta; Lee, Y. C.; Lin, I. N.; Lin, L. J.; Lee, J. F.; Lee, H. Y.; Shimada, T.

In: Journal of the European Ceramic Society, Vol. 27, No. 8-9 SPEC. ISS., 02.04.2007, p. 2995-2999.

Research output: Contribution to journalArticle

Chen, Mei Yu ; Chang, P. J. ; Chia, Chi-Ta ; Lee, Y. C. ; Lin, I. N. ; Lin, L. J. ; Lee, J. F. ; Lee, H. Y. ; Shimada, T. / Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg 1/3 Ta 2/3 )O 3 In: Journal of the European Ceramic Society. 2007 ; Vol. 27, No. 8-9 SPEC. ISS. pp. 2995-2999.
@article{96d0aef946fe4541ad1720b6d7cc1b9f,
title = "Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg 1/3 Ta 2/3 )O 3",
abstract = "Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni 1/3 Ta 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO 6 octahedra, that is A 1g (O) phonon near 800 cm -1 , are strongly correlated to the microwave properties of xBa(Ni 1/3 Mg 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples. The large Raman shift and the large width of the A 1g (O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg 1/3 Ta 2/3 )O 3 ceramic.",
keywords = "Extended X-ray absorption fine structure (EXAFS)",
author = "Chen, {Mei Yu} and Chang, {P. J.} and Chi-Ta Chia and Lee, {Y. C.} and Lin, {I. N.} and Lin, {L. J.} and Lee, {J. F.} and Lee, {H. Y.} and T. Shimada",
year = "2007",
month = "4",
day = "2",
doi = "10.1016/j.jeurceramsoc.2006.11.025",
language = "English",
volume = "27",
pages = "2995--2999",
journal = "Journal of the European Ceramic Society",
issn = "0955-2219",
publisher = "Elsevier BV",
number = "8-9 SPEC. ISS.",

}

TY - JOUR

T1 - Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg 1/3 Ta 2/3 )O 3

AU - Chen, Mei Yu

AU - Chang, P. J.

AU - Chia, Chi-Ta

AU - Lee, Y. C.

AU - Lin, I. N.

AU - Lin, L. J.

AU - Lee, J. F.

AU - Lee, H. Y.

AU - Shimada, T.

PY - 2007/4/2

Y1 - 2007/4/2

N2 - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni 1/3 Ta 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO 6 octahedra, that is A 1g (O) phonon near 800 cm -1 , are strongly correlated to the microwave properties of xBa(Ni 1/3 Mg 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples. The large Raman shift and the large width of the A 1g (O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg 1/3 Ta 2/3 )O 3 ceramic.

AB - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni 1/3 Ta 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO 6 octahedra, that is A 1g (O) phonon near 800 cm -1 , are strongly correlated to the microwave properties of xBa(Ni 1/3 Mg 2/3 )O 3 + (1 - x)Ba(Mg 1/3 Ta 2/3 )O 3 samples. The large Raman shift and the large width of the A 1g (O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg 1/3 Ta 2/3 )O 3 ceramic.

KW - Extended X-ray absorption fine structure (EXAFS)

UR - http://www.scopus.com/inward/record.url?scp=33947710798&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33947710798&partnerID=8YFLogxK

U2 - 10.1016/j.jeurceramsoc.2006.11.025

DO - 10.1016/j.jeurceramsoc.2006.11.025

M3 - Article

AN - SCOPUS:33947710798

VL - 27

SP - 2995

EP - 2999

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

SN - 0955-2219

IS - 8-9 SPEC. ISS.

ER -