Abstract
Information regarding the conductivity type of Si/GeOx/Ni structures with various stoichiometry has been obtained using experiments on injection of minority carriers from n- and p-type silicon. Results show that non-stoichiometric GeOx films exhibit bipolar conductivity, that is, holes as well as electrons contribute to the charge transport. Stoichiometric GeO2 films exhibit unipolar electron conductivity.
Original language | English |
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Article number | 232904 |
Journal | Applied Physics Letters |
Volume | 103 |
Issue number | 23 |
DOIs | |
Publication status | Published - 2013 Dec 2 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)