ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications

Ming Dou Ker, Chun Yu Lin, Yi Han Wu, Wen Tai Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

On-chip electrostatic discharge (ESD) protection design with low-leakage consideration for the silicon chips of IoT applications is presented. The proposed ESD protection design uses the fast turn-on silicon-controlled rectifier (SCR) device to implement the power-rail ESD clamp circuit. Experimental results verified in TSMC 28nm CMOS process have shown that the proposed design has advantages of low leakage current (2∼3nA), low trigger voltage (∼2V), high ESD robustness (>8kV), and free to latchup issue.

Original languageEnglish
Title of host publication2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1496-1499
Number of pages4
ISBN (Print)9781538604892
DOIs
Publication statusPublished - 2018 Aug 24
Event7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017 - Honolulu, United States
Duration: 2017 Jul 312017 Aug 4

Publication series

Name2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017

Conference

Conference7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
CountryUnited States
CityHonolulu
Period17/7/3117/8/4

Keywords

  • CMOS
  • electrostatic discharge (ESD)
  • ESD protection
  • low-leakage

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Control and Optimization

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  • Cite this

    Ker, M. D., Lin, C. Y., Wu, Y. H., & Wang, W. T. (2018). ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications. In 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017 (pp. 1496-1499). [8446566] (2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CYBER.2017.8446566