Abstract
The electrostatic discharge (ESD) immunity test for EMC was one important reliability regulation. The turn-on-efficient on-chip ESD protection circuit is required to clamp the overstress voltage. A new design of ESD protection diodes with embedded silicon-controlled rectifier (SCR) was proposed to protect the gigahertz differential low-noise amplifier (LNA). Experimental results had shown that the proposed ESD protection design for the differential LNA can achieve excellent ESD robustness and good RF performances.
Original language | English |
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Title of host publication | 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 322-324 |
Number of pages | 3 |
ISBN (Electronic) | 9781479966707 |
DOIs | |
Publication status | Published - 2015 Aug 3 |
Event | Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 - Taipei, Taiwan Duration: 2015 May 25 → 2015 May 29 |
Other
Other | Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 |
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Country | Taiwan |
City | Taipei |
Period | 2015/05/25 → 2015/05/29 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation