ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun Yu Lin; Ming Dou Ker; Yuan Wen Hsiao

doi:10.1109/ICICDT.2010.5510294

ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun Yu Lin^*, Ming Dou Ker, Yuan Wen Hsiao

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

Original language	English
Title of host publication	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages	39-42
Number of pages	4
DOIs	https://doi.org/10.1109/ICICDT.2010.5510294
Publication status	Published - 2010
Externally published	Yes
Event	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France Duration: 2010 Jun 2 → 2010 Jun 4

Publication series

Name	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Other

Other	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Country/Territory	France
City	Grenoble
Period	2010/06/02 → 2010/06/04

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/ICICDT.2010.5510294

Cite this

Lin, C. Y., Ker, M. D., & Hsiao, Y. W. (2010). ESD protection design for differential low-noise amplifier with cross-coupled SCR. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (pp. 39-42). Article 5510294 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510294

ESD protection design for differential low-noise amplifier with cross-coupled SCR. / Lin, Chun Yu; Ker, Ming Dou; Hsiao, Yuan Wen.
2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 39-42 5510294 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lin, CY, Ker, MD & Hsiao, YW 2010, ESD protection design for differential low-noise amplifier with cross-coupled SCR. in 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010., 5510294, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, pp. 39-42, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, Grenoble, France, 2010/06/02. https://doi.org/10.1109/ICICDT.2010.5510294

@inproceedings{3800be2eaff64674939a73f1204997a3,

title = "ESD protection design for differential low-noise amplifier with cross-coupled SCR",

abstract = "A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.",

author = "Lin, {Chun Yu} and Ker, {Ming Dou} and Hsiao, {Yuan Wen}",

year = "2010",

doi = "10.1109/ICICDT.2010.5510294",

language = "English",

isbn = "9781424457748",

series = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

pages = "39--42",

booktitle = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

note = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 ; Conference date: 02-06-2010 Through 04-06-2010",

}

TY - GEN

T1 - ESD protection design for differential low-noise amplifier with cross-coupled SCR

AU - Lin, Chun Yu

AU - Ker, Ming Dou

AU - Hsiao, Yuan Wen

PY - 2010

Y1 - 2010

N2 - A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

AB - A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

UR - http://www.scopus.com/inward/record.url?scp=77955607970&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77955607970&partnerID=8YFLogxK

U2 - 10.1109/ICICDT.2010.5510294

DO - 10.1109/ICICDT.2010.5510294

M3 - Conference contribution

AN - SCOPUS:77955607970

SN - 9781424457748

T3 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

SP - 39

EP - 42

BT - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

T2 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Y2 - 2 June 2010 through 4 June 2010

ER -

ESD protection design for differential low-noise amplifier with cross-coupled SCR

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