ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun-Yu Lin, Ming Dou Ker, Yuan Wen Hsiao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages39-42
Number of pages4
DOIs
Publication statusPublished - 2010 Aug 20
Event2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
Duration: 2010 Jun 22010 Jun 4

Publication series

Name2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Other

Other2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
CountryFrance
CityGrenoble
Period10/6/210/6/4

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Lin, C-Y., Ker, M. D., & Hsiao, Y. W. (2010). ESD protection design for differential low-noise amplifier with cross-coupled SCR. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (pp. 39-42). [5510294] (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510294