INIS
annealing
100%
absorption
100%
alloys
100%
x-ray diffraction
100%
silicon nitrides
100%
resolution
50%
losses
50%
interfaces
50%
relaxation
50%
nanocrystals
50%
plasma
50%
nitrogen
50%
transmission electron microscopy
50%
heat treatments
50%
molecular beam epitaxy
50%
optical properties
50%
Physics
Diffraction
100%
Alloy
100%
Infrared Absorption
100%
Optical Transition
100%
Nitrogen
50%
Transmission Electron Microscopy
50%
Molecular Beam Epitaxy
50%
Optical Properties
50%
High Resolution
50%
Nanocrystal
50%
Material Science
Alloy
100%
Silicon Nitride
100%
Molecular Beam Epitaxy
50%
Optical Property
50%
Nanocrystal
50%
Transmission Electron Microscopy
50%
Structural Relaxation
50%
Biochemistry, Genetics and Molecular Biology
Optics
100%
X Ray Diffraction
66%
Sample
66%
Absorption
66%
Infrared Radiation
66%
Phase Separation
33%
Nanocrystal
33%