Abstract
Information on the electronic structures of the gallium nitride (GaN) nanowires and thin films was obtained by employing x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM). The apparent depression of the SPEM intensity for the nanowires was not interpreted as a decrease of the density of valence-band states. The transition probabilities were enhanced in the nanowires.
| Original language | English |
|---|---|
| Pages (from-to) | 3949-3951 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 82 |
| Issue number | 22 |
| DOIs | |
| Publication status | Published - 2003 Jun 2 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)