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Effects of tungsten thickness and annealing temperature on the electrical properties of W-TiO2 thin films
Chia Ching Wu, Cheng Fu Yang*, Yuan Tai Hsieh, Wen Ray Chen, Chin Guo Kuo, Hong Hsin Huang
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
9
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(Scopus)