Effects of step-edge conditions on the magnetoresistance of La 0.7Sr0.3MnO3 tunneling junctions

L. M. Wang, Chen Chung Liu, H. C. Yang, H. E. Horng

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)


    La0.7Sr0.3MnO3 (LSMO) tunneling magnetoresistance (TMR) junctions have been successfully fabricated on step-edge (001) SrTiO3 substrates with various step-edge conditions. We report the fabrication techniques of LSMO step-edge TMR junctions in which the standard photolithography and ion-beam etching techniques are used to control the step angle and step height. We study the influence of step-edge conditions on the resistance and MR behavior of LSMO TMR junctions. It is found that the magnitude of junction resistance increases with an increase of step angle or with a decrease of d/H ratio, where d is the film thickness and H the step height. Based on our results, we conclude that a suitable d/H ratio of ∼0.5-0.9 with a high step angle of φ≥70° can be regarded as the optimum conditions for the fabrication of step-edge TMR junctions.

    Original languageEnglish
    Pages (from-to)359-364
    Number of pages6
    JournalThin Solid Films
    Issue number2
    Publication statusPublished - 2004 Jun 15


    • Atomic force microscopy
    • Electrical properties and measurements
    • Sputtering
    • Tunneling

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Metals and Alloys
    • Materials Chemistry

    Fingerprint Dive into the research topics of 'Effects of step-edge conditions on the magnetoresistance of La <sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub> tunneling junctions'. Together they form a unique fingerprint.

    Cite this