Abstract
With a properly fabricated low-noise SQUID, we have studied the effects of microwave radiation on the noise behavior. Under an ac bias, with increasing microwave power, the critical current and the voltage modulation depth ΔV = Φ0VΦ/π decrease, but the SQUID resistance Rs increases, suggesting a dynamical interaction between the charge carriers and the electromagnetic wave. Furthermore, the microwave radiation modifies drastically the functional dependence of SΦ and ΔV on ac bias current.
| Original language | English |
|---|---|
| Pages (from-to) | 373-378 |
| Number of pages | 6 |
| Journal | Solid State Communications |
| Volume | 116 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 2000 Oct 16 |
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry
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