Effects of microwave radiation on the noise in high-Tc YBa2Cu3O7 dc SQUID magnetometer

P. H. Chang, H. C. Yang, H. E. Horng

    Research output: Contribution to journalArticle

    Abstract

    With a properly fabricated low-noise SQUID, we have studied the effects of microwave radiation on the noise behavior. Under an ac bias, with increasing microwave power, the critical current and the voltage modulation depth ΔV = Φ0VΦ/π decrease, but the SQUID resistance Rs increases, suggesting a dynamical interaction between the charge carriers and the electromagnetic wave. Furthermore, the microwave radiation modifies drastically the functional dependence of SΦ and ΔV on ac bias current.

    Original languageEnglish
    Pages (from-to)373-378
    Number of pages6
    JournalSolid State Communications
    Volume116
    Issue number7
    DOIs
    Publication statusPublished - 2000 Oct 16

    Fingerprint

    SQUIDs
    Magnetometers
    magnetometers
    Microwaves
    microwaves
    Bias currents
    Critical currents
    Beam plasma interactions
    Charge carriers
    Electromagnetic waves
    low noise
    charge carriers
    critical current
    electromagnetic radiation
    Modulation
    modulation
    Electric potential
    electric potential
    barium copper yttrium oxide
    interactions

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Materials Chemistry

    Cite this

    Effects of microwave radiation on the noise in high-Tc YBa2Cu3O7 dc SQUID magnetometer. / Chang, P. H.; Yang, H. C.; Horng, H. E.

    In: Solid State Communications, Vol. 116, No. 7, 16.10.2000, p. 373-378.

    Research output: Contribution to journalArticle

    @article{15697db8dc3e46f9bff8b5677d26f72d,
    title = "Effects of microwave radiation on the noise in high-Tc YBa2Cu3O7 dc SQUID magnetometer",
    abstract = "With a properly fabricated low-noise SQUID, we have studied the effects of microwave radiation on the noise behavior. Under an ac bias, with increasing microwave power, the critical current and the voltage modulation depth ΔV = Φ0VΦ/π decrease, but the SQUID resistance Rs increases, suggesting a dynamical interaction between the charge carriers and the electromagnetic wave. Furthermore, the microwave radiation modifies drastically the functional dependence of SΦ and ΔV on ac bias current.",
    author = "Chang, {P. H.} and Yang, {H. C.} and Horng, {H. E.}",
    year = "2000",
    month = "10",
    day = "16",
    doi = "10.1016/S0038-1098(00)00341-0",
    language = "English",
    volume = "116",
    pages = "373--378",
    journal = "Solid State Communications",
    issn = "0038-1098",
    publisher = "Elsevier Limited",
    number = "7",

    }

    TY - JOUR

    T1 - Effects of microwave radiation on the noise in high-Tc YBa2Cu3O7 dc SQUID magnetometer

    AU - Chang, P. H.

    AU - Yang, H. C.

    AU - Horng, H. E.

    PY - 2000/10/16

    Y1 - 2000/10/16

    N2 - With a properly fabricated low-noise SQUID, we have studied the effects of microwave radiation on the noise behavior. Under an ac bias, with increasing microwave power, the critical current and the voltage modulation depth ΔV = Φ0VΦ/π decrease, but the SQUID resistance Rs increases, suggesting a dynamical interaction between the charge carriers and the electromagnetic wave. Furthermore, the microwave radiation modifies drastically the functional dependence of SΦ and ΔV on ac bias current.

    AB - With a properly fabricated low-noise SQUID, we have studied the effects of microwave radiation on the noise behavior. Under an ac bias, with increasing microwave power, the critical current and the voltage modulation depth ΔV = Φ0VΦ/π decrease, but the SQUID resistance Rs increases, suggesting a dynamical interaction between the charge carriers and the electromagnetic wave. Furthermore, the microwave radiation modifies drastically the functional dependence of SΦ and ΔV on ac bias current.

    UR - http://www.scopus.com/inward/record.url?scp=0034299067&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=0034299067&partnerID=8YFLogxK

    U2 - 10.1016/S0038-1098(00)00341-0

    DO - 10.1016/S0038-1098(00)00341-0

    M3 - Article

    AN - SCOPUS:0034299067

    VL - 116

    SP - 373

    EP - 378

    JO - Solid State Communications

    JF - Solid State Communications

    SN - 0038-1098

    IS - 7

    ER -