Dual-Mode GaN MOS-HEMT of Cascode Configuration with Si Ferroelectric Hf1-xZrxO2FET

  • C. Y. Liao
  • , K. Y. Hsiang
  • , Z. F. Lou
  • , C. Y. Lin
  • , W. C. Ray
  • , F. S. Chang
  • , C. C. Wang
  • , Z. X. Li
  • , H. C. Tseng
  • , J. Y. Lee
  • , P. H. Chen
  • , J. H. Tsai
  • , P. G. Chen*
  • , M. H. Lee
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The dual-mode (D-mode & E-mode) GaN MOS-HEMT is achieved simultaneously by a Cascode configuration with Si ferroelectric (FE) FET. Due to hole absence in 2DEG of GaN HEMT, the conventional FE-gate stack on GaN is difficult to obtain FE-hysteresis with dipole switching in FE-layer. The proposed method is a solution to accomplish ferroelectric hysteresis for modulated modes of GaN-FET.

Original languageEnglish
Title of host publication2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665459792
DOIs
Publication statusPublished - 2022
Event2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022 - Honolulu, United States
Duration: 2022 Jun 112022 Jun 12

Publication series

Name2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022

Conference

Conference2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
Country/TerritoryUnited States
CityHonolulu
Period2022/06/112022/06/12

Keywords

  • Cascode
  • E-mode
  • Ferroelectric
  • GaN HEMT

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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