Double-tip scanning tunneling microscope for surface analysis

Q. Niu*, M. C. Chang, C. K. Shih

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

Abstract

We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

Original languageEnglish
Pages (from-to)5502-5505
Number of pages4
JournalPhysical Review B
Volume51
Issue number8
DOIs
Publication statusPublished - 1995

ASJC Scopus subject areas

  • Condensed Matter Physics

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