Double-tip scanning tunneling microscope for surface analysis

Q. Niu, M. C. Chang, C. K. Shih

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

Original languageEnglish
Pages (from-to)5502-5505
Number of pages4
JournalPhysical Review B
Volume51
Issue number8
DOIs
Publication statusPublished - 1995 Jan 1

Fingerprint

Surface analysis
Ballistics
ballistics
Microscopes
microscopes
Scanning
scanning
Interfacial energy
Green's function
Phase shift
mean free path
surface energy
phase shift
Green's functions
Scattering
Defects
Electrons
probes
defects
scattering

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Double-tip scanning tunneling microscope for surface analysis. / Niu, Q.; Chang, M. C.; Shih, C. K.

In: Physical Review B, Vol. 51, No. 8, 01.01.1995, p. 5502-5505.

Research output: Contribution to journalArticle

Niu, Q. ; Chang, M. C. ; Shih, C. K. / Double-tip scanning tunneling microscope for surface analysis. In: Physical Review B. 1995 ; Vol. 51, No. 8. pp. 5502-5505.
@article{a7d6df3d04ad46b8abd0e2d0d796b8bc,
title = "Double-tip scanning tunneling microscope for surface analysis",
abstract = "We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.",
author = "Q. Niu and Chang, {M. C.} and Shih, {C. K.}",
year = "1995",
month = "1",
day = "1",
doi = "10.1103/PhysRevB.51.5502",
language = "English",
volume = "51",
pages = "5502--5505",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
number = "8",

}

TY - JOUR

T1 - Double-tip scanning tunneling microscope for surface analysis

AU - Niu, Q.

AU - Chang, M. C.

AU - Shih, C. K.

PY - 1995/1/1

Y1 - 1995/1/1

N2 - We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

AB - We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

UR - http://www.scopus.com/inward/record.url?scp=4243855607&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4243855607&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.51.5502

DO - 10.1103/PhysRevB.51.5502

M3 - Article

AN - SCOPUS:4243855607

VL - 51

SP - 5502

EP - 5505

JO - Physical Review B

JF - Physical Review B

SN - 2469-9950

IS - 8

ER -