The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering