Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung*, H. C. Yang, T. R. Yang, B. C. Yao, H. E. Horng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

Original languageEnglish
Pages (from-to)2223-2224
Number of pages2
JournalPhysica C: Superconductivity and its applications
Issue numberPART 4
Publication statusPublished - 1991 Dec 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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