Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung; H. C. Yang; T. R. Yang; B. C. Yao; H. E. Horng

doi:10.1016/0921-4534(91)91236-W

Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung^*, H. C. Yang, T. R. Yang, B. C. Yao, H. E. Horng

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

Original language	English
Pages (from-to)	2223-2224
Number of pages	2
Journal	Physica C: Superconductivity and its applications
Volume	185-189
Issue number	PART 4
DOIs	https://doi.org/10.1016/0921-4534(91)91236-W
Publication status	Published - 1991 Dec 1

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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abstract = "The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.",

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AU - Yao, B. C.

AU - Horng, H. E.

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N2 - The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

AB - The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

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Dissipative behavior due to flux motion in ultrathin YBaCuO films

Abstract

ASJC Scopus subject areas

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