Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung, H. C. Yang, T. R. Yang, B. C. Yao, H. E. Horng

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

Original languageEnglish
Pages (from-to)2223-2224
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume185-189
Issue numberPART 4
DOIs
Publication statusPublished - 1991 Dec 1

Fingerprint

Ultrathin films
Fluxes
Thick films
thick films
Creep

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Dissipative behavior due to flux motion in ultrathin YBaCuO films. / Sung, H. H.; Yang, H. C.; Yang, T. R.; Yao, B. C.; Horng, H. E.

In: Physica C: Superconductivity and its Applications, Vol. 185-189, No. PART 4, 01.12.1991, p. 2223-2224.

Research output: Contribution to journalArticle

Sung, H. H. ; Yang, H. C. ; Yang, T. R. ; Yao, B. C. ; Horng, H. E. / Dissipative behavior due to flux motion in ultrathin YBaCuO films. In: Physica C: Superconductivity and its Applications. 1991 ; Vol. 185-189, No. PART 4. pp. 2223-2224.
@article{5b6c8f842a844af68942efdca49ee6e7,
title = "Dissipative behavior due to flux motion in ultrathin YBaCuO films",
abstract = "The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.",
author = "Sung, {H. H.} and Yang, {H. C.} and Yang, {T. R.} and Yao, {B. C.} and Horng, {H. E.}",
year = "1991",
month = "12",
day = "1",
doi = "10.1016/0921-4534(91)91236-W",
language = "English",
volume = "185-189",
pages = "2223--2224",
journal = "Physica C: Superconductivity and its Applications",
issn = "0921-4534",
publisher = "Elsevier",
number = "PART 4",

}

TY - JOUR

T1 - Dissipative behavior due to flux motion in ultrathin YBaCuO films

AU - Sung, H. H.

AU - Yang, H. C.

AU - Yang, T. R.

AU - Yao, B. C.

AU - Horng, H. E.

PY - 1991/12/1

Y1 - 1991/12/1

N2 - The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

AB - The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

UR - http://www.scopus.com/inward/record.url?scp=0026375463&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026375463&partnerID=8YFLogxK

U2 - 10.1016/0921-4534(91)91236-W

DO - 10.1016/0921-4534(91)91236-W

M3 - Article

AN - SCOPUS:0026375463

VL - 185-189

SP - 2223

EP - 2224

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

IS - PART 4

ER -