Dissipative behavior due to flux motion in ultrathin YBaCuO films

H. H. Sung, H. C. Yang, T. R. Yang, B. C. Yao, H. E. Horng

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The resistive transition of ultrathin YBCO films in a field has been measured to study the dissipative behavior due to flux motion. The thickness of the films is in the order of 30 - 40 nm. The broadening of the resistive transition is compared with that of thick films. The results are discussed in the framework of the flux creep theory.

Original languageEnglish
Pages (from-to)2223-2224
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume185-189
Issue numberPART 4
DOIs
Publication statusPublished - 1991 Dec 1

ASJC Scopus subject areas

  • Condensed Matter Physics

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