TY - GEN
T1 - Directly determining the coefficient of thermal expansion of high-power light-emitting diodes by optical coherence tomography
AU - Yeh, Ting Wei
AU - Chou, Chun Yang
AU - Huang, Chun Ying
AU - Yao, Yung Chi
AU - Haung, Yi Kai
AU - Tsai, Meng Tsan
AU - Lee, Ya Ju
N1 - Publisher Copyright:
© OSA 2018.
PY - 2018
Y1 - 2018
N2 - The coefficient of thermal expansion (CTE) is a physical quantity that indicates the thermal expansion value of a material upon heating. For advanced thermal management, the accurate and immediate determination of the CTE of packaging materials is gaining importance because the demand for high-power lighting-emitting diodes (LEDs) is currently increasing. In this study, we used optical coherence tomography (OCT) to measure the CTE of an InGaN-based (λ = 450 nm) high-power LED encapsulated in polystyrene resin. The distances between individual interfaces of the OCT images were observed and recorded to derive the instantaneous CTE of the packaged LED under different injected currents. The LED junction temperature at different injected currents was established with the forward voltage method. Most importantly, this work validates the hypothesis that OCT can provide an alternative way to directly and nondestructively determine the spatially resolved CTE of the packaged LED device, which offers significant advantages over traditional CTE measurement techniques.
AB - The coefficient of thermal expansion (CTE) is a physical quantity that indicates the thermal expansion value of a material upon heating. For advanced thermal management, the accurate and immediate determination of the CTE of packaging materials is gaining importance because the demand for high-power lighting-emitting diodes (LEDs) is currently increasing. In this study, we used optical coherence tomography (OCT) to measure the CTE of an InGaN-based (λ = 450 nm) high-power LED encapsulated in polystyrene resin. The distances between individual interfaces of the OCT images were observed and recorded to derive the instantaneous CTE of the packaged LED under different injected currents. The LED junction temperature at different injected currents was established with the forward voltage method. Most importantly, this work validates the hypothesis that OCT can provide an alternative way to directly and nondestructively determine the spatially resolved CTE of the packaged LED device, which offers significant advantages over traditional CTE measurement techniques.
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U2 - 10.1364/CLEO_AT.2018.JTh2A.171
DO - 10.1364/CLEO_AT.2018.JTh2A.171
M3 - Conference contribution
AN - SCOPUS:85049151485
SN - 9781943580422
T3 - Optics InfoBase Conference Papers
BT - CLEO
PB - Optica Publishing Group (formerly OSA)
T2 - CLEO: Applications and Technology, CLEO_AT 2018
Y2 - 13 May 2018 through 18 May 2018
ER -