TY - GEN
T1 - Development of composite vertical wet etching for silicon material
AU - Huang, Mao Jung
AU - Chang, Chun Ming
AU - Chu, Nien Nan
AU - Tang, Yu Hsiang
AU - Yang, Chii Rong
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/9/23
Y1 - 2014/9/23
N2 - In this research, we combined the electrochemical etching (ECE) and the metal-assisted chemical etching (MACE) to develop a composite vertical etching process for silicon material and then discuss the etching results influenced by experimental parameters. The experimental results show that the developed composite etching process has faster etching rate than both electrochemical etching and metal-assisted chemical etching process. When a bias of 0.25 V is applied and the catalytic material is 10 nm in thickness, a 30 μm-depth vertical structure can be generated which is 3 times than the structure yield by metal-assisted chemical etching.
AB - In this research, we combined the electrochemical etching (ECE) and the metal-assisted chemical etching (MACE) to develop a composite vertical etching process for silicon material and then discuss the etching results influenced by experimental parameters. The experimental results show that the developed composite etching process has faster etching rate than both electrochemical etching and metal-assisted chemical etching process. When a bias of 0.25 V is applied and the catalytic material is 10 nm in thickness, a 30 μm-depth vertical structure can be generated which is 3 times than the structure yield by metal-assisted chemical etching.
KW - Bulk silicon micromachining
KW - Electrochemical etching
KW - Metal assisted chemical etching
UR - http://www.scopus.com/inward/record.url?scp=84908654168&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84908654168&partnerID=8YFLogxK
U2 - 10.1109/NEMS.2014.6908875
DO - 10.1109/NEMS.2014.6908875
M3 - Conference contribution
AN - SCOPUS:84908654168
T3 - 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014
SP - 564
EP - 567
BT - 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014
Y2 - 13 April 2014 through 16 April 2014
ER -