TY - GEN
T1 - Developing a robust classifier for fault detection in production environment
AU - Chen, Long Sheng
AU - Hsu, Chun Chin
AU - Chen, Li Fei
PY - 2009
Y1 - 2009
N2 - Recently, machine learning algorithms are widely applied to production such as failures identification, finished products inspection, and process monitoring. Applying these algorithms to fault detection makes it possible to eliminate additional tests or experiments which usually involve high expense and highly risk. However, when applying machine learning methods to the real world data, the class imbalance problem usually has been ignored. This problem is caused by imbalanced data, in which almost all the examples are labeled as one class whilst far fewer objects are labeled as the other class. When deal with such imbalanced data, a classifier induced from an imbalanced data set has high classification accuracy for the majority class, but an unacceptable error rate for the minority class. To solve this problem, this work proposed a novel method, called SOM (Self-Organizing Maps) based methodology. A process monitoring data has been provided to demonstrate the effectiveness of the proposed method. Experimental results indicated the proposed method outperforms traditional techniques, under-sampling and cluster based sampling.
AB - Recently, machine learning algorithms are widely applied to production such as failures identification, finished products inspection, and process monitoring. Applying these algorithms to fault detection makes it possible to eliminate additional tests or experiments which usually involve high expense and highly risk. However, when applying machine learning methods to the real world data, the class imbalance problem usually has been ignored. This problem is caused by imbalanced data, in which almost all the examples are labeled as one class whilst far fewer objects are labeled as the other class. When deal with such imbalanced data, a classifier induced from an imbalanced data set has high classification accuracy for the majority class, but an unacceptable error rate for the minority class. To solve this problem, this work proposed a novel method, called SOM (Self-Organizing Maps) based methodology. A process monitoring data has been provided to demonstrate the effectiveness of the proposed method. Experimental results indicated the proposed method outperforms traditional techniques, under-sampling and cluster based sampling.
UR - http://www.scopus.com/inward/record.url?scp=79960915813&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79960915813&partnerID=8YFLogxK
U2 - 10.3182/20090603-3-RU-2001.0093
DO - 10.3182/20090603-3-RU-2001.0093
M3 - Conference contribution
AN - SCOPUS:79960915813
SN - 9783902661432
T3 - IFAC Proceedings Volumes (IFAC-PapersOnline)
SP - 270
EP - 275
BT - Proceedings of the 13th IFAC Symposium on Information Control Problems in Manufacturing, INCOM'09
PB - IFAC Secretariat
ER -