Design of local ESD clamp for cross-power-domain interface circuits

Chun Yu Lin, Yu Kai Chiu, Shuan Yu Yueh

Research output: Contribution to journalLetter

Abstract

To effectively protect the cross-power-domain interface circuits from electrostatic discharge (ESD) damages, a PMOS-based local ESD clamp was proposed in this work. The test circuits of prior and proposed designs have been implemented in silicon chip. The proposed design has the small chip area, low leakage current, and low peak transient voltage; therefore, it can help to reduce the overstress voltages across the interface circuits under ESD tests. With the better performances, the proposed local ESD clamp can be a better solution for cross-power-domain interface circuits.

Original languageEnglish
Article numberpp.20160806
JournalIEICE Electronics Express
Volume13
Issue number20
DOIs
Publication statusPublished - 2016 Jan 1

Keywords

  • Cross-power-domain interface circuits
  • Electrostatic discharge (ESD)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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