Design of dual-band ESD protection for 24-/60-GHz millimeter-wave circuits

Li Wei Chu, Chun Yu Lin, Ming Dou Ker

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

To effectively protect the millimeter-wave (MMW) circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, a dual-band ESD protection cell for 24-/60-GHz ESD protection is presented in this paper. The proposed ESD protection cell consisted of a diode, a silicon-controlled rectifier, a PMOS, and two inductors. To verify the dual-band characteristics and ESD robustness, the proposed ESD protection circuit had been applied to a 24-/60-GHz low-noise amplifier (LNA). The measurement results showed over-2-kV human-body-model ESD robustness with little performance degradation on LNA. The proposed dual-band ESD protection cell was suitable for circuit designers for them to easily apply ESD protection in the dual-band MMW circuits.

Original languageEnglish
Article number6296697
Pages (from-to)110-118
Number of pages9
JournalIEEE Transactions on Device and Materials Reliability
Volume13
Issue number1
DOIs
Publication statusPublished - 2013
Externally publishedYes

Keywords

  • CMOS
  • dual-band
  • electrostatic discharge (ESD) protection
  • millimeter-wave (MMW)
  • radio frequency (RF)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality

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