Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process

Chun Yu Lin, Li Wei Chu, Ming Dou Ker

Research output: Contribution to journalArticle

8 Citations (Scopus)


The configurable electrostatic discharge (ESD) protection cells have been implemented in a commercial 65-nm CMOS process for 60-GHz RF applications. The distributed ESD protection scheme was modified to be used in this work. With the consideration of parasitic capacitance from I/O pad, the ESD protection cells have reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable ESD protection. Experimental results of these ESD protection cells have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. These ESD protection cells can easily be used for ESD protection design in the 60-GHz RF applications, and accelerate the design cycle.

Original languageEnglish
Pages (from-to)1315-1324
Number of pages10
JournalMicroelectronics Reliability
Issue number8
Publication statusPublished - 2011 Aug 1


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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