Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments

INIS

• control 100%
• environment 100%
• design 100%
• detection 100%
• precision 100%
• atomic force microscopy 100%
• accuracy 66%
• meters 33%
• performance 33%
• height 33%
• microstructure 33%
• signals 33%
• sensitivity 33%
• feedback 33%
• size 33%
• images 33%
• positioning 33%
• piezoelectricity 33%
• topography 33%
• measuring methods 33%
• gratings 33%
• compacts 33%

Engineering

• Environment 100%
• Detection 100%
• Atomic Force Microscopy 100%
• Accuracy 66%
• Sliding-Mode Controller 66%
• Performance 33%
• Images 33%
• Multiple-Input Multiple-Output 33%
• Experimental Result 33%
• Stages 33%
• Integration 33%
• Measurer 33%
• High Sensitivity 33%
• Fast Response 33%
• Piezoelectric 33%
• Deflection 33%
• Microstructure 33%
• Atomic Force Microscope 33%
• Nanometre 33%

Physics

• Environment 100%
• Controllers 100%
• Atomic Force Microscopy 100%
• Contours 100%
• Performance 25%
• Standard 25%
• Images 25%
• Responses 25%
• Recognition 25%
• Measuring Instruments 25%
• Plane 25%
• Feedback 25%
• Piezoelectricity 25%
• Deflection 25%
• Microstructure 25%