Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments

Jim Wei Wu, Jyun Jhih Chen, Kuan Chia Huang, Chih Lieh Chen, Yi Ting Lin, Mei Yung Chen, Li Chen Fu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Atomic force microscope (AFM) is equipped with height recognition with nano and sub-nano meter scale, and it can accurately build three-dimensional (3D) imaging of samples with micro-structure. In this paper, we propose a homemade phase-detection mode atomic force microscopy (PM-AFM). In measuring system, here we use a compact CD/DVD pick-up-head to measure the cantilever deflection. In scanning system, we use piezoelectric stages as the planar scanner. For the sake of accurately obtaining the contour of tender cells, first we design an MIMO adaptive double integral sliding mode controller (ADISMC) in xy-plane to increase the positioning accuracy and provide precision cell size. Second, in z-axis we design an adaptive complementary sliding-mode controller (ACSMC) to improve the scanning accuracy and to overcome the inconvenience for user with traditional proportional-integration controller. Besides, we use phase feedback signal, which features with higher sensitivity and faster response. Finally, the extensive experimental results are used to validate the performance of the proposed controller, quantify the scanning image quality of standard grating and reconstruct cells topography.

Original languageEnglish
Title of host publication2013 American Control Conference, ACC 2013
Pages5488-5493
Number of pages6
Publication statusPublished - 2013
Externally publishedYes
Event2013 1st American Control Conference, ACC 2013 - Washington, DC, United States
Duration: 2013 Jun 172013 Jun 19

Other

Other2013 1st American Control Conference, ACC 2013
CountryUnited States
CityWashington, DC
Period13/6/1713/6/19

Keywords

  • adaptive complementary sliding mode control
  • adaptive double integral sliding mode control
  • Atomic force microscopy
  • CD/DVD PUH
  • phase-detection mode

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Wu, J. W., Chen, J. J., Huang, K. C., Chen, C. L., Lin, Y. T., Chen, M. Y., & Fu, L. C. (2013). Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments. In 2013 American Control Conference, ACC 2013 (pp. 5488-5493). [6580696]